Data record std.ieee-1584.structure.annex-f-and-g

Verified 2026-10-24 Confidence: Medium

Annex F of IEEE 1584-2018 summarizes in Table F.1 the laboratory test series behind the model by open-circuit voltage, current, gap and enclosure, and Annex G explains how the model was developed from those tests and how the applicability range of clause 4.2 was decided.

ProvenanceIEEE 1584-2018 supports data record std.ieee-1584.structure.annex-f-and-g, which is cited on the entry IEEE Guide for Performing Arc-Flash Hazard Calculations.SOURCEIEEE 1584-2018IEEE 1584-2018Licensed standard, clause Annex F, Annex GDATA RECORDstd.ieee-1584.structure.annex-f-and-gstd.ieee-1584.structure...Verified 2026-10-24ENTRYIEEE Guide for Performing Arc-Flash Hazard CalculationsIEEE Guide for Performin..No revisions
Provenance. Where this record comes from and where it is used: the cited source, the record itself and the entry that cites it.
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StepItemDetail
SourceIEEE 1584-2018Licensed standard, clause Annex F, Annex G
Data recordstd.ieee-1584.structure.annex-f-and-gVerified 2026-10-24
EntryIEEE Guide for Performing Arc-Flash Hazard CalculationsNo revisions
Subject
IEEE Guide for Performing Arc-Flash Hazard Calculations (Standards)
Kind
Standard scope
Source
IEEE 1584-2018, clause Annex F, Annex G, Guide for Performing Arc-Flash Hazard Calculations, IEEE.

History

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DateChange
2026-10-24created
2026-10-24review_status unreviewed -> software_reviewed

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Cite the governing standard for the fact itself; cite this page as the finding aid.

"Data record std.ieee-1584.structure.annex-f-and-g." Electrical Testing Reference. 2026-10-24. https://www.electricaltestingreference.com/data/std.ieee-1584.structure.annex-f-and-g/.