Data record std.ieee-1584.structure.enclosure-correction
Verified 2026-10-24 Confidence: High
Clause 4.8 of IEEE 1584-2018 supplies the enclosure size correction factor: clause 4.8.2 distinguishes a shallow enclosure from a typical one by voltage and dimension criteria, clause 4.8.3 converts the actual height and width to equivalent dimensions, and Table 7 provides the correction coefficients by box type and electrode configuration for the equations of clause 4.8.4.
| Step | Item | Detail |
|---|---|---|
| Source | IEEE 1584-2018 | Licensed standard, clause 4.8 |
| Data record | std.ieee-1584.structure.enclosure-correction | Verified 2026-10-24 |
| Entry | IEEE Guide for Performing Arc-Flash Hazard Calculations | No revisions |
- Subject
- IEEE Guide for Performing Arc-Flash Hazard Calculations (Standards)
- Kind
- Standard scope
- Source
- IEEE 1584-2018, clause 4.8, Guide for Performing Arc-Flash Hazard Calculations, IEEE.
History
| Date | Change |
|---|---|
| 2026-10-24 | created |
| 2026-10-24 | review_status unreviewed -> software_reviewed |
Cite this page
Cite the governing standard for the fact itself; cite this page as the finding aid.
"Data record std.ieee-1584.structure.enclosure-correction." Electrical Testing Reference. 2026-10-24. https://www.electricaltestingreference.com/data/std.ieee-1584.structure.enclosure-correction/.
Electrical Testing Reference, Data record std.ieee-1584.structure.enclosure-correction (Oct. 24, 2026), https://www.electricaltestingreference.com/data/std.ieee-1584.structure.enclosure-correction/.
@misc{etr-data-std-ieee-1584-structure-enclosure-correction,
title = {Data record std.ieee-1584.structure.enclosure-correction},
howpublished = {\url{https://www.electricaltestingreference.com/data/std.ieee-1584.structure.enclosure-correction/}},
organization = {Electrical Testing Reference},
publisher = {Electrical Testing Reference},
year = {2026},
note = {last substantive change 2026-10-24}
}{{cite web |title=Data record std.ieee-1584.structure.enclosure-correction |website=Electrical Testing Reference |publisher=Electrical Testing Reference |url=https://www.electricaltestingreference.com/data/std.ieee-1584.structure.enclosure-correction/ |date=2026-10-24 |access-date=}}