Data record `std.ieee-1584.structure.multiple-locations-and-sources`

Verified 2026-10-24 Confidence: High

Clause 6.10 of IEEE 1584-2018 treats the line side, the bus and the load side of devices in different compartments of one piece of equipment as separate arcing locations, each calculated with the worst kept; an integral main device earns credit only where it is adequately isolated from the bus, and motor contribution enters both the device operating time and the total arcing current. For a location fed from more than one source, illustrated by the dual-fed motor control center of Figure 1, each source device is operated in sequence and the arcing current is redistributed after every operation.

Provenance. Where this record comes from and where it is used: the cited source, the record itself and the entry that cites it.

Provenance: the chain from source to entry.
Step	Item	Detail
Source	IEEE 1584-2018	Licensed standard, clause 6.10
Data record	std.ieee-1584.structure.multiple-locations-and-sources	Verified 2026-10-24
Entry	IEEE Guide for Performing Arc-Flash Hazard Calculations	No revisions

Subject: IEEE Guide for Performing Arc-Flash Hazard Calculations (Standards)
Kind: Standard scope
Source: IEEE 1584-2018, clause 6.10, Guide for Performing Arc-Flash Hazard Calculations, IEEE.

History

Every recorded change to this data record, oldest first.
Date	Change
2026-10-24	created
2026-10-24	revised
2026-10-24	review_status unreviewed -> software_reviewed

Cite this page

Cite the governing standard for the fact itself; cite this page as the finding aid.

"Data record std.ieee-1584.structure.multiple-locations-and-sources." Electrical Testing Reference. 2026-10-24. https://www.electricaltestingreference.com/data/std.ieee-1584.structure.multiple-locations-and-sources/.

Electrical Testing Reference, Data record std.ieee-1584.structure.multiple-locations-and-sources (Oct. 24, 2026), https://www.electricaltestingreference.com/data/std.ieee-1584.structure.multiple-locations-and-sources/.

@misc{etr-data-std-ieee-1584-structure-multiple-locations-and-sources,
  title = {Data record std.ieee-1584.structure.multiple-locations-and-sources},
  howpublished = {\url{https://www.electricaltestingreference.com/data/std.ieee-1584.structure.multiple-locations-and-sources/}},
  organization = {Electrical Testing Reference},
  publisher = {Electrical Testing Reference},
  year = {2026},
  note = {last substantive change 2026-10-24}
}

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