Data record tests.system-function-testing.ieee1547-1.on-off-test

Verified 2026-10-24 Confidence: High

Commissioning test CT1 in clause 8.2.3.1 of IEEE 1547.1-2020 is an on-off test: the DER is brought online from off in the specified mode while the voltage response of the Area EPS, the intentional delay and the ramp to steady state are observed, a disconnect and reconnect are simulated, and cease to energize is verified when all ungrounded phases are opened by some device other than the interconnection device and, for multiphase DER, when one phase is opened at the PoC. Observations are reviewed with the Area EPS operator, results are documented with the agreement of both operators, and any failure carries agreed corrective action and a repeat of the test.

ProvenanceIEEE 1547.1-2020 supports data record tests.system-function-testing.ieee1547-1.on-off-test, which is cited on the entry System Function Testing.SOURCEIEEE 1547.1-2020IEEE 1547.1-2020Licensed standard, clause 8.2.3.1DATA RECORDtests.system-function-testing.ieee1547-1.on-off-testtests.system-function-te..Verified 2026-10-24ENTRYSystem Function TestingSystem Function TestingNo revisions
Provenance. Where this record comes from and where it is used: the cited source, the record itself and the entry that cites it.
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StepItemDetail
SourceIEEE 1547.1-2020Licensed standard, clause 8.2.3.1
Data recordtests.system-function-testing.ieee1547-1.on-off-testVerified 2026-10-24
EntrySystem Function TestingNo revisions
Subject
System Function Testing (Test methods)
Kind
Method fact
Source
IEEE 1547.1-2020, clause 8.2.3.1, Conformance Test Procedures for Equipment Interconnecting Distributed Energy Resources, IEEE.

History

Every recorded change to this data record, oldest first.
DateChange
2026-10-24created
2026-10-24revised
2026-10-24review_status unreviewed -> software_reviewed

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"Data record tests.system-function-testing.ieee1547-1.on-off-test." Electrical Testing Reference. 2026-10-24. https://www.electricaltestingreference.com/data/tests.system-function-testing.ieee1547-1.on-off-test/.